Keithley 4200A-SCS High Performance Parameter Analyzer from Tektronix

2 weeks ago by Luke James

The Keithley 4200A-SCS Parameter Analyzer is an accurate research tool that facilitates reliability and failure analysis studies of semiconductor devices, materials, and process development.

As the "highest performance parameter analyzer" according to Tektronix, the 4200A-SCS delivers synchronizing current-voltage (I-V), capacitance-voltage (C-V) and ultra-fast pulsed I-V measurements. 

The analyzer also reduces characterization complexity and test setup by up to 50%, providing clear and uncompromised measurement capability. Plus, embedded measurement expertise, a first for a product of its kind, provides test guidance and provides design engineers with confidence in their results. 

 

4200A-SCS Product Features

In addition to the above, the 4200A-SCS Parameter Analyzer is fully customizable and completely upgradable. This allows design engineers to add, remove, chop, and change instruments as and when it suits them. 

 

The Keighley 4200A-SCS parameter analyzer.

The Keithley 4200A-SCS parameter analyzer. Image Credit: Tektronix.

 

4200A-SCS also features a Clarius GUI-based software that features embedded measurement expertise and hundreds of ready-to-use application tests to provide clear measurement and unparalleled analytical capability. 

 

Other Key Features Include:

  • Industry’s first instrument with built-in measurement.

  • Tutorial videos from application engineers in four languages.

  • Pin to pad contact check ensures reliable measurements.

  • Multiple measurement functions.

  • Data display, analysis, and arithmetic functions.

  • Ready-to-use, modifiable application tests, projects and devices that reduce test development time.

 

Low Current Measurements with 4200A-SCS MSUs

Two new source measure unit (SMU) modules can be used with the 4200A-SCS for low-current measurements in the presence of high load capacitance. The 4201-SMU and 4211-SMU are designed solely for test setups with long cables, switch matrices, gate contacts to the chuck, and other fixturing.

These test setups, required in a number of low current measurement applications, can increase capacitance seen at SMU output even where the device being tested has a very low capacitance. When test connection capacitance is too high, any resulting low current measurements can become unstable.

The 4201-SMU and 4211-SMU address these challenges by sourcing voltage and measure over current with longer cables or more connection capacitance. This saves engineers a whole lot of time and costs that would be spent on troubleshooting and reconfiguration. 

At the lowest supported current measurement range, both the 4201 and 4211-SMU can source into and measure a system that is 1,000 more times capacitive than what is currently possible. 

Each 4200A-SCS Parameter Analyzer can be configured with up to nine of these SMUs. 

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