P
Paul E. Schoen
- Jan 1, 1970
- 0
I have been having seemingly random noise problems where my PIC-based USB
device will go into a USBSuspendControl state, and it requires the cable to
be removed and replaced to reestablish communication. The problem usually
occurs in the field where there is switching of high current and high
voltage, but I was able to duplicate it to some extent by running the USB
cable along an AC power line to a current source which I switched on and
off.
Recently I suspected that the USB cable itself might be at fault, because I
had bought a batch of 100 pieces for $0.69 each (but now about $1.50) from
www.CableWholesale.com, and several of these were sent to a customer who
reported problems, while a previous customer with an older cable did not
seem to experience this very much, and another customer replaced his cable
with a longer one, and he said his unit was working OK.
So, I dissected one of the new cables by removing the PVC jacket in the
middle, and I found a substantial tinned copper braid shield, and an
aluminized Mylar wrap under that. When I removed the shield I could see that
the four USB conductors were twisted together, which is generally good for
noise induced by strong magnetic fields. So far, so good.
But when I measured continuity from the connector shells to the exposed
shield, I got intermittent readings of about 3 to 30 ohms and sometimes an
open circuit. Then I measured the continuity from shell to shell on a couple
other USB cables I had been using, and I found that one showed an open
circuit and the others showed intermittent. This was the case for two new
cables from different sources. Yet I measured the shells of a USB cable for
my Nikon digital camera (with a mini-USB on the camera end), and I got a
solid connection of less than 1 ohm.
I still need to do more testing and I may also purchase a high grade cable
with gold plated connectors and better shielding. They are about $20. I will
also have my customer check the continuity and try a better cable. Perhaps a
USB 3.0 cable will work better.
I removed the PVC molded cover for the male type "A" connector, and there is
a metal shell that extends back and tapers to a smaller "neck" where the
cable is clinched or crimped. By bending the ears on the crimp I was able to
separate part of the metal housing to reveal where the shield has been
folded back and exposed so that the inner surface of the housing presses
against it. But it seems that the jacket of the cable is a continuous
molding that fills the shell of the connector, and the crimp mechanism can
only apply light force to the exposed part of the shield. So the actual
connection may degrade with time as a non-conductive film may form on the
metal surfaces, and mechanical flexing may further degrade the connection.
Here are pictures of the cable after dissection and exposure of the crimped
shield connection:
http://cygnus.smart.net/~pstech/photos/USB_Cable_23.JPG
http://cygnus.smart.net/~pstech/photos/USB_Cable_Conn-A_26a.JPG
http://cygnus.smart.net/~pstech/photos/USB_Cable_Conn-A_27.JPG
http://cygnus.smart.net/~pstech/photos/USB_Cable_Conn-A_28.JPG
http://cygnus.smart.net/~pstech/photos/USB_Cable_Conn-A_29.JPG
http://cygnus.smart.net/~pstech/photos/USB_Cable_Conn-A_30.JPG
I think this is a design defect and I should be able to get a refund or
credit for the unused cables. It may not be the reason for the problem but I
should be able to determine that if my customers replace the cables with
high performance versions and their problems are greatly reduced.
Anyone else have experience with this? One member of the Microchip forums
reported that he found the following with some new cables he had on hand:
Poundland 1.8 m A-A(F) yellow 8 ohms
Signalex 1.5 m A-A(F) white OPEN CIRCUIT!
Signalex 1.5 m A-B white OPEN CIRCUIT!
CPC 1.8 m A-B translucent yellow 18.5 ohms
IXIOS 3 m A-A(F) translucent/silver grey gold plated connectors
<0.5 ohms
Paul
device will go into a USBSuspendControl state, and it requires the cable to
be removed and replaced to reestablish communication. The problem usually
occurs in the field where there is switching of high current and high
voltage, but I was able to duplicate it to some extent by running the USB
cable along an AC power line to a current source which I switched on and
off.
Recently I suspected that the USB cable itself might be at fault, because I
had bought a batch of 100 pieces for $0.69 each (but now about $1.50) from
www.CableWholesale.com, and several of these were sent to a customer who
reported problems, while a previous customer with an older cable did not
seem to experience this very much, and another customer replaced his cable
with a longer one, and he said his unit was working OK.
So, I dissected one of the new cables by removing the PVC jacket in the
middle, and I found a substantial tinned copper braid shield, and an
aluminized Mylar wrap under that. When I removed the shield I could see that
the four USB conductors were twisted together, which is generally good for
noise induced by strong magnetic fields. So far, so good.
But when I measured continuity from the connector shells to the exposed
shield, I got intermittent readings of about 3 to 30 ohms and sometimes an
open circuit. Then I measured the continuity from shell to shell on a couple
other USB cables I had been using, and I found that one showed an open
circuit and the others showed intermittent. This was the case for two new
cables from different sources. Yet I measured the shells of a USB cable for
my Nikon digital camera (with a mini-USB on the camera end), and I got a
solid connection of less than 1 ohm.
I still need to do more testing and I may also purchase a high grade cable
with gold plated connectors and better shielding. They are about $20. I will
also have my customer check the continuity and try a better cable. Perhaps a
USB 3.0 cable will work better.
I removed the PVC molded cover for the male type "A" connector, and there is
a metal shell that extends back and tapers to a smaller "neck" where the
cable is clinched or crimped. By bending the ears on the crimp I was able to
separate part of the metal housing to reveal where the shield has been
folded back and exposed so that the inner surface of the housing presses
against it. But it seems that the jacket of the cable is a continuous
molding that fills the shell of the connector, and the crimp mechanism can
only apply light force to the exposed part of the shield. So the actual
connection may degrade with time as a non-conductive film may form on the
metal surfaces, and mechanical flexing may further degrade the connection.
Here are pictures of the cable after dissection and exposure of the crimped
shield connection:
http://cygnus.smart.net/~pstech/photos/USB_Cable_23.JPG
http://cygnus.smart.net/~pstech/photos/USB_Cable_Conn-A_26a.JPG
http://cygnus.smart.net/~pstech/photos/USB_Cable_Conn-A_27.JPG
http://cygnus.smart.net/~pstech/photos/USB_Cable_Conn-A_28.JPG
http://cygnus.smart.net/~pstech/photos/USB_Cable_Conn-A_29.JPG
http://cygnus.smart.net/~pstech/photos/USB_Cable_Conn-A_30.JPG
I think this is a design defect and I should be able to get a refund or
credit for the unused cables. It may not be the reason for the problem but I
should be able to determine that if my customers replace the cables with
high performance versions and their problems are greatly reduced.
Anyone else have experience with this? One member of the Microchip forums
reported that he found the following with some new cables he had on hand:
Poundland 1.8 m A-A(F) yellow 8 ohms
Signalex 1.5 m A-A(F) white OPEN CIRCUIT!
Signalex 1.5 m A-B white OPEN CIRCUIT!
CPC 1.8 m A-B translucent yellow 18.5 ohms
IXIOS 3 m A-A(F) translucent/silver grey gold plated connectors
<0.5 ohms
Paul