J
James Waldby
- Jan 1, 1970
- 0
Paul said:....
Just my opinion: The test point resistance method would seem to be
easier to implement for automated testing.
Microscopes, micrometers and other such techniques will work fine for
sampling incoming parts, but its going to be more time consuming for
higher volume testing.
Some other techniques in use are eddy current measurements, beta
backscatter, and x-ray fluorescence. See eg
http://www.oicm.com/products/cmi95.php and links from
http://www.globalspec.com/Supplier/ProductAnnouncements/FischerTechnology