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help on electron detection

Discussion in 'Electrical Engineering' started by philosophus, Jun 27, 2007.

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  1. philosophus

    philosophus Guest

    I'm working on a research topic that involves detection of secondary
    electrons induced by energetic ions. Secondary electron emission may
    originate from the substrate from which ions emerge, or ions may be forced
    to pass through a thin carbon foil (thin enough not to generate too much
    straggling and cause loss of resolution) and secondary electrons are emitted
    from the foil.

    The problem is the detection of electrons... The ions and electrons are
    separated by a crossed electric/magnetic filter: energetic ions travel
    straight to the ion detector and electrons are steered in the magnetic field
    onto the electron detector. The electron detector is a chevron microchannel
    plate (MCP). A time-of-flight spectrum is obtained when the signals from the
    two detectors are run in coincidence.

    Although sounds rather straightforward, I've had difficulties for a long
    time with detection of electrons. I can get a reasonable electron count on
    the electron MCP; but when I run the two detectors in coincidence, I either
    get no spectrum, or a spectrum with spurious peaks. Most of time, the peaks
    do not make physical sense due to the geometry of the time-of-flight

    If anyone has any past experience on this kind of a problem, I'd greatly
    appreciate comments.


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