Maker Pro
Maker Pro

Ganging H-Bridges

J

Jon Slaughter

Jan 1, 1970
0
Is it common to parallel h-bridges?
 
It isn't usually a good idea - the tolerance on the gate threshold
voltages usually means that one side of the pair carries the bulk of
the current, and as that device gets hotter its gate threshold voltage
will drop, leading it to carry even more.
BTW, I can't seem to find any in-expensive H-Bridges for 180W@12V so I was
thinking of using two of these

http://www.fairchildsemi.com/ds/FD/FDD8424H.pdf

At currents above 30A the postive temperature coefficient of the
channel resistance of these parts beats out the negative temperature
coefficient of the gate source voltage, so if you are looking to
switch more than 60A you might get away with it.

Otherwise you'd need to add a small resistance in series with each
source to force current sharing.
 
J

Jon Slaughter

Jan 1, 1970
0
Terry Given said:
sounds like a recipe for disaster at currents below 30A. But its also why
IGBTs can be direct paralleled (nice +ve tempco). Extremely tight thermal
coupling can get around a lot of the problems though.


the easiest way to parallel H-bridges is with interphase reactors to soak
up all the little variations. Depending on the load, split the first
inductor into N inductors for N bridges, each N times more henries and
1/Nth the current so each one is N*(1/N)^2 = N times smaller. join the
ends of the inductors together, then continue with the rest of your
circuit.


I don't see any difference between parallel H-bridges and discretizing the
H-bridge and paralleling the individual mosfets... which is no problem.
 
I don't see any difference between parallel H-bridges and discretizing the
H-bridge and paralleling the individual mosfets... which is no problem.

If you don't think it is a problem, you haven't been doing it for long
enough or on a large enough scale.

If you want to parallel MOSFETs or discrete transistors you almost
always have to add components to make sure that each active device
carries more or less the same current. Production tolerance is not
your friend.
 
J

Jon Slaughter

Jan 1, 1970
0
If you don't think it is a problem, you haven't been doing it for long
enough or on a large enough scale.

If you want to parallel MOSFETs or discrete transistors you almost
always have to add components to make sure that each active device
carries more or less the same current. Production tolerance is not
your friend.


But this contradicts AOE and many other sources I have read that say
paralleling them is no problem. MOSFETS have negative temperature
coefficients rather than positive like BJT's. (hence as one gets hotter it
gets more resistive and less current will flow through it and through the
other.. they should ultimately balance out, in proportion, if it is not too
bad)

I assume then you mean that one mosfet might take a little more current than
another because they are not exactly the same. Ok, that might be true but
then you just add one more mosfet to the mix and it should compensate enough
(assuming they are not that much different, which I imagine they aren't).

The only issue it says is that the more you parallelize the more gate cap
you have hence its harder to drive(and eventually becomes impossible).
Of course that stuff is for discrete mosfets and I'm not sure about
h-bridges(specially since they probably have more circuitry in it for other
things, in general).
 
But this contradicts AOE and many other sources I have read that say
paralleling them is no problem. MOSFETS have negative temperature
coefficients rather than positive like BJT's. (hence as one gets hotter it
gets more resistive and less current will flow through it and through the
other.. they should ultimately balance out, in proportion, if it is not too
bad)

Go back to my original response (the third one in the list) and read
it to the end. Then take a careful look at the datasheet that you
posted. MOSFETs only had a positive temperature coefficient for high
drain currents - higher than you are likely to be using. Check out the
drain current versus gate-voltage curves in the data sheet you posted,
rather relying on Win Hill's thirty year-old observation about a much
smaller MOSFET than you will be using - the 2N4351 data in his figure
3.13 switches to a positive temperature coefficient at 2mA, which the
Fairchild part you are contemplating has a negative temperature
coefficient up to 30A.

And MOSFETs have fairly large gate threshold voltage tolerances, so
you are quite likely to start off with all the current going through
one of your parallelled MOSFETs, which isn't a good start.
I assume then you mean that one mosfet might take a little more current than
another because they are not exactly the same.  Ok, that might be true but
then you just add one more mosfet to the mix and it should compensate enough
(assuming they are not that much different, which I imagine they aren't).

Using your imagination is a poor substitute for reading the data sheet
carefully
The only issue it says is that the more you parallelize the more gate cap
you have hence its harder to drive(and eventually becomes impossible).

It never becomes impossible - the switching times just grow in direct
poroportion to the number of MOSFET's.
Of course that stuff is for discrete mosfets and I'm not sure about
h-bridges(specially since they probably have more circuitry in it for other
things, in general).

Dream on. If they do incorporate current limiting or thermal
protection, the data sheet will tell you about it, and you won't want
either to come into action in normal operation.
 
essentially you are both right.

Diplomatic, but wrong.
The trick is to keep them in very close
proximity, with extremely tight thermal coupling. And dont forget to use
one Rg per FET. Symmetry is your ally here; visual disharmony is the enemy..

Good advice, but it doesn't help current sharing, for which you need a
source resistor per part if you aren't operating at high enough
currents for the positve temperature coefficient of the channel
resistance to swamp the negative temperature coefficient of the gate
threshold voltage.
 
J

Jon Slaughter

Jan 1, 1970
0
But this contradicts AOE and many other sources I have read that say
paralleling them is no problem. MOSFETS have negative temperature
coefficients rather than positive like BJT's. (hence as one gets hotter it
gets more resistive and less current will flow through it and through the
other.. they should ultimately balance out, in proportion, if it is not
too
bad)

Go back to my original response (the third one in the list) and read
it to the end. Then take a careful look at the datasheet that you
posted. MOSFETs only had a positive temperature coefficient for high
drain currents - higher than you are likely to be using. Check out the
drain current versus gate-voltage curves in the data sheet you posted,
rather relying on Win Hill's thirty year-old observation about a much
smaller MOSFET than you will be using - the 2N4351 data in his figure
3.13 switches to a positive temperature coefficient at 2mA, which the
Fairchild part you are contemplating has a negative temperature
coefficient up to 30A.

And MOSFETs have fairly large gate threshold voltage tolerances, so
you are quite likely to start off with all the current going through
one of your parallelled MOSFETs, which isn't a good start.
I assume then you mean that one mosfet might take a little more current
than
another because they are not exactly the same. Ok, that might be true but
then you just add one more mosfet to the mix and it should compensate
enough
(assuming they are not that much different, which I imagine they aren't).

Using your imagination is a poor substitute for reading the data sheet
carefully
The only issue it says is that the more you parallelize the more gate cap
you have hence its harder to drive(and eventually becomes impossible).

It never becomes impossible - the switching times just grow in direct
poroportion to the number of MOSFET's.
Of course that stuff is for discrete mosfets and I'm not sure about
h-bridges(specially since they probably have more circuitry in it for
other
things, in general).

Dream on. If they do incorporate current limiting or thermal
protection, the data sheet will tell you about it, and you won't want
either to come into action in normal operation.

--------

I suggest you read

http://www.irf.com/technical-info/appnotes/para.pdf

because you seem to think MOSFETS = BJT's.
 
J

Jon Slaughter

Jan 1, 1970
0
I suggest you read
http://www.irf.com/technical-info/appnotes/para.pdf

because you seem to think MOSFETS = BJT's.

for example,

"Differential RDS (on) will cause current unbalance and extra conduction
losses as expected, but these are limited due to the

positive temperature coefficient for MOSFET resistance. The thermal
'runaway' characteristic of other semiconductor technologies

does not apply to MOSFETs."



"Gain factor differentials (DGF) result in limited current unbalance. In the
extreme, which is difficult to realize in practice,

the current unbalance is limited to the gain ratio. Since turn-on
differentials are very easy to control, the predominate loss

differential occurs during turn-off."



And the pdf just about contradicts everything you have said so far. (except
maybe in the rare case where there is a complete parameter mismatch). Of
course its not only the pdf but other sources too.
 
for example,

"Differential RDS (on) will cause current unbalance and extra conduction
losses as expected, but these are limited due to the

positive temperature coefficient for MOSFET resistance. The thermal
'runaway' characteristic of other semiconductor technologies

does not apply to MOSFETs."

"Gain factor differentials (DGF) result in limited current unbalance. In the
extreme, which is difficult to realize in practice,

the current unbalance is limited to the gain ratio. Since turn-on
differentials are very easy to control, the predominate loss

differential occurs during turn-off."

And the pdf just about contradicts everything you have said so far. (except
maybe in the rare case where there is a complete parameter mismatch).  Of
course its not only the pdf but other sources too.

Current differentials during turn-on and turn-off do depend on the
differences between the device gate-threshold voltages. For the
Fairchild parts you nominated, the worst case limits are 1V and 3V. A
1V part would be carrying about 50A before a 3V part started to turn
on. Paralleling two transistors with that level of mismatch would put
almost all the switching disipation in the lower threshold part.

Forsythe weasels around this point - his job is selling MOSFETs - but
it's in his paper, if you read it carefully.
 
I suspect Bill is thinking about linear applications.

I suspect that neither Terry nor Jon has thought about the increased
dissipation in MOSFET switches during switching. My 1996 Peltier
junction thermostat paper talked about setting the switching frequency
for the PWM output stage at around 200kHz to get roughly equal static
and dynamic power dissipiations in our switching MOSFETs - more recent
circuits switch appreciably faster and this dissipation would
presumably be dominant in these applications.
 
I have no idea but I have read about 10 sources, one such as AOE, that says
they can easily be paralleled and say nothing else about "issues" that bill
is talking about. Of course if you just take two random mosfets(such as a
power and a small signal) and throw them together then it probably won't
work... but that pdf says in general there are no issues and only when the
parameters are significantly mismatched will there be an issue.

My guess is he really think's MOSFET's are BJT's cause everything he is
talking about pretty much applies to BJT's but not MOSFET's.

Don't guess. Dig out a calcular or dig into LTSpice and work out what
would actually happen.

People are good at ignoring issues they don't want to think about, or
aren't important in the area of their immediate interest. For the
Fairchild FDD8424H that you were thinking about using, the 1V to 3V
range tolerance on the gate threshold voltage - if manifested between
two parallelled switching transistors - would have the lower threshold
transistor carrying some 50A more of the switching current than its
high threshold partner.

How much extra switching dissipation this would generate in the lower
threshold part depends on the complex impedance of the load being
switched, but it could well be that the lower threshold part would be
doing all the heavy switching.
 
Go back to my original response (the third one in the list) and read
it to the end. Then take a careful look at the datasheet that you
posted. MOSFETs only had a positive temperature coefficient for high
drain currents - higher than you are likely to be using. Check out the
drain current versus gate-voltage curves in the data sheet you posted,
rather relying on Win Hill's thirty year-old observation about a much
smaller MOSFET than you will be using - the 2N4351 data in his figure
3.13 switches to a positive temperature coefficient at 2mA, which the
Fairchild part you are contemplating has a negative temperature
coefficient up to 30A.

And MOSFETs have fairly large gate threshold voltage tolerances, so
you are quite likely to start off with all the current going through
one of your parallelled MOSFETs, which isn't a good start.


Using your imagination is a poor substitute for reading the data sheet
carefully


It never becomes impossible - the switching times just grow in direct
poroportion to the number of MOSFET's.


Dream on. If they do incorporate current limiting or thermal
protection, the data sheet will tell you about it, and you won't want
either to come into action in normal operation.

--------

I suggest you read

http://www.irf.com/technical-info/appnotes/para.pdf

because you seem to think MOSFETS = BJT's

Don't be silly.

If you are using the devices purely as switches, the situation does
get more complicated.

The static current distribution is then determined entirely by the
"on" channel resistance, and while - as Forsythe says - you still have
to take into account the worst case tolerance range in the on channel
resistance, at least you can rely on a positive temperature
coefficient to avoid a bad distribution getting worse.

The data sheet for the Fairchild parts you nominated doesn't specify a
worst case minimum "on" resistance;
the typical to worst case maximum ratio is close to 3:4 so one might
hope for a minimum to maximum ratio of 2:1 which isn't too good.

The dynamic current distribution - while the switches are turning on
and off - does depend on the gate threshold vvoltage, with most of the
current concentrating on the part with the lowest threshold voltage
when the devices turn on and turn off. The switches don't spend all
that long a time switching on and off, but a lot of power gets
dissipated in the junctions while this is going on - I used to select
switching frequencies such that the static and dynamic power
dissipations in the switches were more or less the same, but if I'd
been under pressure to minimise the size and cost of the components
doing the output filtering I'd have probably set the swithing
frequencies rather higher.
 
J

Jon Slaughter

Jan 1, 1970
0
Terry Given said:
I suspect Bill is thinking about linear applications.

I have no idea but I have read about 10 sources, one such as AOE, that says
they can easily be paralleled and say nothing else about "issues" that bill
is talking about. Of course if you just take two random mosfets(such as a
power and a small signal) and throw them together then it probably won't
work... but that pdf says in general there are no issues and only when the
parameters are significantly mismatched will there be an issue.

My guess is he really think's MOSFET's are BJT's cause everything he is
talking about pretty much applies to BJT's but not MOSFET's.
 
Top