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About random and systematic yield loss

Discussion in 'Electronic Design' started by [email protected], Aug 11, 2007.

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  1. Guest

    Dear All

    Currently I read about systematic yield and random yield effect on
    the
    overall yield of wafer.
    I have no idea how people actually group the systematic yield and
    random yield separately.


    Do people get the overall yield from probing and then run
    statistically tool and analysis to get the
    systematic and random yield by some advanced curve fitting
    techniques?


    OR some matrix of different conditions need to be run in order to
    find
    the systematic part of the sensitivity in yield loss?


    I believe the first one should be more advisable.


    Kindly enlighten.
    Thank you for your help in advance.


    best regards
    Jason
     
  2. JosephKK

    JosephKK Guest

    posted to
    sci.electronics.design:
    You need to understand the terms in regard to general manufacturing
    first. Then the specific application to IC's and wafers follows
    with minimal effort.
     
  3. Guest

    Dear Joseph

    Thanks a lot

    Any links you could share for understanding the general term and
    calculation of each term?

    Thank you
    Jason
     
  4. JosephKK

    JosephKK Guest

    posted to
    sci.electronics.design:
    While i generally don't do your googling for you, i will test for
    some useful search strings and show some hopefully useful links:

    search strings:

    random yield losses
    systematic yield losses
    yield loss modeling

    links:
    holomirage.com/Articles/TI_CAL.doc
    http://www.edn.com/index.asp?layout=article&articleid=CA500806&partner=enews&text=synopsys
    http://www.siliconfareast.com/test-yield-models.htm
     
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