Connect with us

About random and systematic yield loss

Discussion in 'Electronic Design' started by [email protected], Aug 11, 2007.

Scroll to continue with content
  1. Guest

    Dear All

    Currently I read about systematic yield and random yield effect on
    overall yield of wafer.
    I have no idea how people actually group the systematic yield and
    random yield separately.

    Do people get the overall yield from probing and then run
    statistically tool and analysis to get the
    systematic and random yield by some advanced curve fitting

    OR some matrix of different conditions need to be run in order to
    the systematic part of the sensitivity in yield loss?

    I believe the first one should be more advisable.

    Kindly enlighten.
    Thank you for your help in advance.

    best regards
  2. JosephKK

    JosephKK Guest

    posted to
    You need to understand the terms in regard to general manufacturing
    first. Then the specific application to IC's and wafers follows
    with minimal effort.
  3. Guest

    Dear Joseph

    Thanks a lot

    Any links you could share for understanding the general term and
    calculation of each term?

    Thank you
  4. JosephKK

    JosephKK Guest

    posted to
    While i generally don't do your googling for you, i will test for
    some useful search strings and show some hopefully useful links:

    search strings:

    random yield losses
    systematic yield losses
    yield loss modeling

Ask a Question
Want to reply to this thread or ask your own question?
You'll need to choose a username for the site, which only take a couple of moments (here). After that, you can post your question and our members will help you out.
Electronics Point Logo
Continue to site
Quote of the day